CHARACTERISATION platform: Joint Platform on COMPONENT Characterisation FACILITIES

a) Description:

-Breakthrough characterisation facilities in the microwave/photonics domain up to the millimetr-frequency range (50-60 GHz)and even higher (>110 GHz):
- Optical analysis in the telecom wavelength range: tuneable sources, high speed modulation and detection, spectrum analysis...
- Microwave measurements: Oscilloscopes, Network Analysers, Spectrum analysis,...
- Wireless and digital signals analysis: Bit Error Rate, Vector Signal Generation and Analysis,...

Signal Generation and Analysis

• Optical signal analyzer for bit rates 10 Gbit/s with a resolution better than 0.3pm in spectral domain and 160fs in temporal domain.
• 12.5 Gb/s BER tester
• BER measurements up to 10 Gbit/s intensity modulated light, possible extension up to 40 Gbit/s
• Spectrum and modulation analysis
• Sampling oscilloscopes
• Bit-Error Rate (BER) measurement with true PRBS up to 50Gb/s:
• Vector Signal Analyser
• Vector Signal Generator
• Vector signal generation (VSG)
• Vector signal analysis (VSA)

• Aglient

Sources and Detectors

• Optical and optoelectronic measure-ments:Modulators and photodetectors up to 60 GHz for signal processing
• Tuneable laser sources -Optoelectronic measurements: spectrum analysis, modulation bandwidth
• wideband PD and EAM
• Optoelectronic conversion
• Tuneable laser sources
• Tuneable Lasers
• Calibrated (responsivity) photodetectors

Test and Measurement

• measurement equipment in mm-wave range
• Optoelectronic test and measurement, including polarimeter, PMD measurement
• 300 GHz spectrum analyser
• Transmission spectroscopy in Terahertz domain.
• Vector network analyser (70-260 GHz)
• Facilities for mm wave characterization
• Optical network analyzer for measuring transmission, reflectivity, GVD and PMD of optical devices and links from 1525 nm -1610 nm
• Phase noise and linearity measurement set up
• network analyser up to 65 GHz
• Network analysis and signal generators
• Wafer probing
• Optical network analyser
• Polarisation analyser
• Autorcorrelator
• Optical heterodyne measurement of ultra-fast devices
• experimental set-up for third-order intermodulation measurements, 2-18 GHz range
• Agilent
  
  

b) Contact the CHARACTERISATION Platform central co-ordinating point